Garcés Fiallos, F. R. (2011). CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP.
Chicago Style CitationGarcés Fiallos, Felipe Rafael. CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP. 2011.
MLA CitationGarcés Fiallos, Felipe Rafael. CRITICAL-POINT YIELD MODEL TO APPRAISE DAMAGE CAUSED BY LEAF BLIGHT IN BEAN CROP. 2011.
Warning: These citations may not always be 100% accurate.