Study of the technique of measuring silica oxide films with the optical reflection method, for its possible implementation using low-cost materials
- Authors
- Tinoco Mosquera, Fabián Patricio
- Format
- BachelorThesis
- Status
- publishedVersion
- Description
- Publication Year
- 2020
- Language
- eng
- Topic
- Espesor
Reflectancia espectral
Interferencia
Equipamiento
Fibra óptica
Thickness
Spectral reflectance
Interference
Equipment
Fiber optic
- Repository
- Repositorio Universidad Yachay Tech
- Rights
- openAccess
- License